Edge629: 1 GHz Timing Deskew and Quad Fanout Element
The Edge629 is a monolithic timing delay and signal fanout solution manufactured in a high-performance bipolar process. In Automatic Test Equipment (ATE) applications, the Edge629 buffers, distributes, and aligns timing signals across multiple channels (typically found inside Memory Test Systems). It is also suitable for per pin deskew in Logic Testers.
Datasheets
- Edge629 Datasheet (PDF 116KB, 7/06)
Application Notes
- Cooling High Density, High Power Pin Electronics (PDF 61KB, 9/05)
- Using the Bipolar DCL Load as a Third Level Source (PDF 123KB, 9/05)
- ATE-to-DUT Interface: Using Ferrites to Replace Relays for Lower Cost and Improved Performance (PDF 307KB, 9/05)
- Optimizing Output Configuration of Semtech Bipolar Pin Drivers (PDF 128KB, 9/05)
- Testing Without Relays - Using Inductors to Compensate for Parasitic Capacitance (PDF 194KB, 9/05)
- Power-on Sequencing for Systems with Multiple Power Supplies (PDF 29KB, 9/05)




